Keeping time in the Ethernet network
Fully stress-test elements
Includes measuring time error and frequency (MTIE/TDEV) to specified limits (e.g. G.826x/7x)
Introduce PTP Time Error Patterns and negative protocol conditions, SyncE Wander and Jitter, and manipulate ToD fields to test device conformance to standards
Captured over long periods, patterns can be replayed accurately to prove and troubleshoot devices
Emulate impairments to fully stress test the network
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